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Wafer and Film Frame Prober/Handler | XY Position Compensation Function | Frame Prober
Wafer Prober | Film Frame | Memory Tester | Chip Prober | DC Tester
Probing Handler for Package Device | Probing Handler (PCP-103SL / PCP-303SL)
Laser Marking System (PCP-105LM / PCP-305LM) | Film Frame Prober (PCP-101SL / PCP-301SL)
 
Probing Handler for Package Device (PCP-103SL)

PCP-103SL made the inspection of Small-sized package circuit base board with Handler (BGA, QFN etc.) by Probing method.

Throughput has drastically improved by applying this Probing method possible for Multi-probing.

Features

  • Probing Area : φ200mm, XY Square 230 × 200 Max
  • Frame Size : Frame for Wafer Size 150mm(2-6-1), 200mm(2-8-1)
  • X & Y linear motor technology for maximum precision.
  • XY Position compensation function by Sampling.
  • Possible for loading more than One Board.Multi-area Alignment function.
  • Correspond to small Chip less than 1mm.
  • Small Space : W1100mm × D860mm
 
 
 

Wafer and Film Frame Prober/Handler | XY Position Compensation Function | Frame Prober
Wafer Prober | Film Frame | Memory Tester | Chip Prober | DC Tester
Probing Handler for Package Device | Probing Handler (PCP-103SL / PCP-303SL)
Laser Marking System (PCP-105LM / PCP-305LM) | Film Frame Prober (PCP-101SL / PCP-301SL)

Visit Plum Five Co, Ltd. Website: www.plumfive.co.jp
  For more information about this product, please call: (632) 6713892
 
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