Explained below is the technique in which XY position compensation function is used.
1. Stage compensation
Acquired and revises machinary accuracy of the stage by a common wafer or a glass mask.
2. Target compensation (PAT)
Actually compensates probing using unmeasured wafer pattern.
Because XY stage accuracy is decided by information theoretically from stage resolution and repeating function acquired by image process after above compensation, extremely high accurate probing is possible.
By utilizing this compensation function, compensation of a chip position by distortion and bending occurred by film tension and dicer blade after dicing, and probing are possible. |